Processing observation
Processing observation
At Aites, we conduct cross-sectional polishing, processing, observation, and analysis.
61～90 item / All 123 items
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Detection of trace elements by EPMA.
Detection sensitivity is excellent! It is particularly superior in quantitative analysis of trace components and map analysis.
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State analysis using EPMA
Estimate bonding states by comparing with standard spectra! Introducing state analysis using EPMA.
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Observation of fracture surfaces by SEM: crab claw
We conducted an observation of the fracture surface of the crab claw that was damaged due to long-term use!
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Cross-sectional observation of copper terminals and elemental analysis using SEM/EDX.
Investigation of the joint condition and joining methods of crimp terminals, as well as the types of materials! Introduction to cross-sectional observation and elemental analysis using SEM/EDX.
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Ink immersion test for implemented parts (dye and pry)
Introducing a test that allows for the observation of fracture and delamination layers by permeating coloring liquids and fluorescent liquids!
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Total coordination from reliability testing to observation.
Reduce the risks of transportation and storage! We provide consistent services from reliability testing to observation.
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Crystal analysis by EBSD: Aluminum weld joint (spot welding)
We will introduce an analysis example confirming that the welded area has a large distribution of grain crystals.
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Observation of aluminum welding joints
Introducing examples of aluminum welding observation. Internal observation through X-ray fluoroscopy and CT inspection allows for clearer observation after cross-section preparation!
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Cross-sectional observation of large samples (expansion valve)
Introducing a case study on the cross-section preparation of a large sample (65mm × 28mm) and the observation of its internal structure!
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Observation of the coating layer of eyeglass lenses using a microtome.
Section preparation using a microtome! Introducing examples of observing lens coating layers and multilayer films.
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Differences in appearance due to SEM observation conditions
Introducing SEM images taken under various conditions! An explanation of the differences in appearance based on SEM observation conditions.
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Analysis and ultra-microhardness measurement of degraded and broken crab hooks.
Introducing a case study on ultra-microhardness measurement! Clear explanations using photos and diagrams!
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Seven spectral crystals in EPMA analysis
Introduction to the measurement principle of wavelength dispersive X-ray spectrometers (WDS) and examples of measurements for 22Ti!
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Changes due to differences in acceleration voltage during EDX analysis.
Confirm changes due to differences in acceleration voltage! Analyze under appropriate conditions based on accumulated know-how!
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Basic Analysis Methods for Things that are Similar Yet Different
Introducing the flow from optical microscope observation with a wide range of applications to SEM observation and EDX elemental analysis!
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[Data] Example of EPMA Analysis
By using LIF and LIFH spectroscopic crystals, peak separation of 22Ti and 56Ba becomes possible!
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[Information] Whisker Observation - Tips for Observing Flat Whiskers
Introducing the differences in appearance due to the device, the differences in appearance based on sample angles, and the light sources!
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Cross-sectional observation by SEM: Connector plating
Exploring the truth! If the communication worsens, it might be worth considering a malfunction in the connector terminal.
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Regarding the curing temperature of epoxy resin during sample encapsulation.
Even with larger-sized implementation boards, resin embedding is possible without cutting before embedding! We will introduce cases with and without heat generation prevention treatment.
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Evaluation of BGA/CSP solder
Measuring the area ratio of internal voids in solder! By combining mechanical polishing, a comprehensive evaluation is possible.
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FE-SEM observation (Crystal grain observation of Al wire bonding section)
High-brightness electron gun for detailed SEM images! Equipped with an in-lens SE detector sensitive to surface information.
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[Example of analysis using EBSD] Silicon wafer
The measured silicon wafer is single crystal! The IPF map, pole figure, and inverse pole figure resulted in relatively simple outcomes.
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[Data] EPMA Analysis Example 2
Analysis by EPMA can detect PET and PETH spectral crystals, allowing for peak separation of 17Cl and 47Ag!
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[Data] Structural Analysis of MEMS Components
Comprehensive analysis of the structure of MEMS components using a combination of non-destructive and destructive methods!
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Authenticity investigation (comparative observation)
Compare the genuine or standard products with the items under investigation! Investigate whether there have been any silent changes, etc.
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Observation of diamond clarity
A microscope allows you to observe tiny defects that cannot be seen with the naked eye!
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Measurement of solder crack rate by cross-sectional observation.
Calculating the crack rate of ball joints and implementing it according to customer specifications!
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Observation of the coating film
Introducing examples of observation and analysis of coating films used in various products, including "microtomes" capable of planar inclined cutting!
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Case study of fisheye analysis of laminate film.
It has been determined that the cause is due to cured ink adhering to the printed surface of the printed PET film!
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Case Study of Foreign Matter Analysis in Laminating Film
Focusing on the position and composition of the foreign object! We prepared a cross-section of the foreign object and conducted elemental analysis.
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