All products and services
301～330 item / All 360 items
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Evaluation of pore distribution in non-woven fabric sheets
Important analysis items for performance evaluation and quality control of functional materials! Evaluation of pore size and pore distribution of non-woven sheets and membrane materials.
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Raman UV-curable resin
The Raman spectrum reflects the functional groups of organic compounds! The curing reaction can be estimated to some extent.
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Analysis case of faulty switch contacts
Appearance inspection, electrical inspection, and internal observation using X-rays conducted! Introduction of analysis cases.
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Observation of Conductive Particle Shapes in COG Implementation
Observing the conductive particles from the planar direction and the cross-sectional direction! A case study confirming the degree of deformation.
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FPD Evaluation and Verification
Evaluate whether there are any potential issues related to characteristics or structure! We propose reliability testing methods and conditions.
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Chemical Analysis Trust Service
Sample 1, including comparison with Ref! Summarize and conduct candidate analytical methods.
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Cross-sectional observation of substrate-mounted components.
Observations before and after reliability testing and cross-sectional observations! Here are examples of observations of various implemented components.
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Cross-sectional observation of substrate-mounted components (1) to (6)
Introducing the "Observation Mode" of a chip capacitor (MLCC) under a microscope!
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Evaluation of particle size of positive electrode active material
Introducing examples of measurement cases for important management items in the production of lithium-ion batteries and all-solid-state batteries!
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Strain measurement in thermal shock testing
Observing the behavior of strain in thermal shock testing! The test materials used are FR-1 and FR-4.
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Examples of semiconductor observation through mechanical polishing.
Cross-section preparation for structural observation and defect analysis of semiconductors! Cross-section preparation comparable to FIB and CP is possible.
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Micro FT-IR
This year, we are introducing new additions! We will introduce the features of the three basic measurement methods.
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Observation of metallic tissue through chemical treatment.
You can gain clues about the quality of the product and investigate defects from the shape of the organization!
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IOL testing of discrete semiconductors
Supports IOL tests and power cycle tests for small discrete semiconductors!
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CP processing device Arblade5000_wide area cross-section milling
It is possible to process with approximately twice the width! This significantly expands the previously localized observation range.
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Micro FT-IR imaging measurement
It is possible to visualize the distribution of substances within the specified plane! Suitable for evaluating the diffusion state of substances, etc.
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Measurement of moisture absorption distortion
We investigated the behavior of strain during moisture absorption and drying using a strain gauge!
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Example of analysis of compounds at the SAC solder and Ni pad interface.
It is also possible to display various maps of each phase! Analysis is based on the information of the crystal structure possessed by the sample.
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In-chamber photography during constant temperature and humidity testing.
At the same time, we also support monitoring of power supply, temperature, and electrical items, as well as checks after extraction!
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Optical film light transmission characteristics
We provide consistent evaluation and analysis from material properties to the mechanisms of their functional expression!
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Power device failure location / Slice & View three-dimensional reconstruction
By reconstructing a three-dimensional image of the damaged area, observe the overall structure of the destroyed object!
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Composition analysis of LIB cathode active materials by ICP luminescence analysis.
ICP emission analysis enables qualitative and quantitative analysis of approximately 70 elements, primarily metal elements!
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Analysis of organic-inorganic composites using FT-IR and EDX.
Here is an example of analyzing organic-inorganic composite materials using FT-IR and SEM-EDX!
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SiC potential defect expansion inspection device
Reproducing bipolar degradation through UV laser irradiation! Sample evaluation that normally takes 2 months can be completed in 2 days.
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Evaluation of various implementation substrates
IPC-A-610 certified IPC specialists are available! Assistance with observations in accordance with international standards.
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Strain measurement of power module package resin.
Measuring the strain behavior of the sealing resin under thermal cycling using a strain gauge!
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Observation of CMOS image sensor cross-section by mechanical polishing.
Due to the advantages and disadvantages, it is necessary to choose according to the sample form, observation range, purpose, etc.!
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Appearance observation and measurement services
We are equipped with a variety of devices to meet your needs, including dimension measurement of various parts and surface roughness measurement!
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NMR analysis of liquid crystal compounds
Introducing the information obtained from NMR, using 1H NMR, 13C NMR, and DEPT measurements as examples!
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Observation of tracking camera cross-section by mechanical polishing.
Observation of the sensor chip surface, creating a cross-section through mechanical polishing in the mounted state, and conducting structural observation of the device!
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