All products and services
301～330 item / All 353 items
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Strain measurement in thermal shock testing
Observing the behavior of strain in thermal shock testing! The test materials used are FR-1 and FR-4.
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Examples of semiconductor observation through mechanical polishing.
Cross-section preparation for structural observation and defect analysis of semiconductors! Cross-section preparation comparable to FIB and CP is possible.
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Micro FT-IR
This year, we are introducing new additions! We will introduce the features of the three basic measurement methods.
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Observation of metallic tissue through chemical treatment.
You can gain clues about the quality of the product and investigate defects from the shape of the organization!
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IOL testing of discrete semiconductors
Supports IOL tests and power cycle tests for small discrete semiconductors!
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CP processing device Arblade5000_wide area cross-section milling
It is possible to process with approximately twice the width! This significantly expands the previously localized observation range.
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Micro FT-IR imaging measurement
It is possible to visualize the distribution of substances within the specified plane! Suitable for evaluating the diffusion state of substances, etc.
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Measurement of moisture absorption distortion
We investigated the behavior of strain during moisture absorption and drying using a strain gauge!
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Example of analysis of compounds at the SAC solder and Ni pad interface.
It is also possible to display various maps of each phase! Analysis is based on the information of the crystal structure possessed by the sample.
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In-chamber photography during constant temperature and humidity testing.
At the same time, we also support monitoring of power supply, temperature, and electrical items, as well as checks after extraction!
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Optical film light transmission characteristics
We provide consistent evaluation and analysis from material properties to the mechanisms of their functional expression!
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Power device failure location / Slice & View three-dimensional reconstruction
By reconstructing a three-dimensional image of the damaged area, observe the overall structure of the destroyed object!
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Composition analysis of LIB cathode active materials by ICP luminescence analysis.
ICP emission analysis enables qualitative and quantitative analysis of approximately 70 elements, primarily metal elements!
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Analysis of organic-inorganic composites using FT-IR and EDX.
Here is an example of analyzing organic-inorganic composite materials using FT-IR and SEM-EDX!
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SiC potential defect expansion inspection device
Reproducing bipolar degradation through UV laser irradiation! Sample evaluation that normally takes 2 months can be completed in 2 days.
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Evaluation of various implementation substrates
IPC-A-610 certified IPC specialists are available! Assistance with observations in accordance with international standards.
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Strain measurement of power module package resin.
Measuring the strain behavior of the sealing resin under thermal cycling using a strain gauge!
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Observation of CMOS image sensor cross-section by mechanical polishing.
Due to the advantages and disadvantages, it is necessary to choose according to the sample form, observation range, purpose, etc.!
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Appearance observation and measurement services
We are equipped with a variety of devices to meet your needs, including dimension measurement of various parts and surface roughness measurement!
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NMR analysis of liquid crystal compounds
Introducing the information obtained from NMR, using 1H NMR, 13C NMR, and DEPT measurements as examples!
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Observation of tracking camera cross-section by mechanical polishing.
Observation of the sensor chip surface, creating a cross-section through mechanical polishing in the mounted state, and conducting structural observation of the device!
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Observation of substrate deformation using a 3D shape measuring machine (VR-6200)
Measure the change state with a 3D shape measuring device! Visually confirm the indented shape and amount due to pressure.
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Component analysis of organic substances (FT-IR and GC/MS)
Introducing how to differentiate the use of FT-IR and GC/MS when conducting component analysis!
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Rubber heat aging test
Capable of conducting various tests such as thermal aging tests and damp heat degradation tests for materials like rubber!
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About the curing temperature of epoxy resin free from hazardous substances.
We conducted measurements to reconfirm the temperature at which heat is generated during hardening!
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Evaluation of tensile properties using a extensometer compatible with high-stretch flexible materials.
To accurately measure strain in a tensile test, measurement using a strain gauge is necessary!
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Cryogenic ion milling cross-section processing example (rubber products)
We will introduce a case study on the method of processing cross-sections using toy car tires!
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Observation of thermal deformation using a 3D shape measurement device (VR-6200)
By combining the VR-6200 with the heater stage, it becomes possible to visualize changes during heating.
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Poisson's ratio measurement
We will select the appropriate extensometer according to the measurement target, so please feel free to consult with us.
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Announcement of the introduction of Talos F200E
Improved resolution for TEM and STEM! Performance has been significantly enhanced, allowing for EDS analysis with four detectors.
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