All products and services
241～270 item / All 353 items
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[Data] Measurement of resin molecular weight by high-temperature GPC (SEC)
The analysis device also supports the analysis and evaluation of polymers! Information on the configuration and principles of high-temperature SEC equipment is provided!
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Introduction to Cross-Section Processing and Observation Methods
Mechanical grinding allows for a wide range of processing and observation! We will propose appropriate processing and observation methods or combinations.
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[Data] GC-MS analysis by solvent extraction
I will introduce examples of comparing the components of color developers contained in thermal paper using solvent extraction!
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[Data] Measurement of the birefringence of laminate film
Explaining the effects of combining PET and EVA! Introducing measurement results using laminated film.
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Announcement of the Introduction of FIB-SEM Helios 5 UC
Cross-section production of soft materials has also been realized! 3D reconstruction is possible with Auto Slice & View!
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Raman spectroscopy acquisition service for minerals in rocks
Assist in the study of rocks and minerals! Raman spectroscopy is very effective for identifying and analyzing mineral species in rocks.
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One-shot 3D shape measuring device "VR-6200"
With this one device, you can measure various things! It can reproduce cross-sectional shapes without cutting, and it can also measure glossy surfaces!
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Measurement examples of DSC (Differential Scanning Calorimetry)
Comparing thermal properties with DSC! We will discuss the impact of type identification and the state of polymer molecular chains on material properties!
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Analysis of Liquid Crystal Display Materials
We propose analytical methods tailored to materials and purposes! Here are examples of chemical analysis for each component, such as liquid crystals and sealing materials.
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Measurement of inorganic particle size using dynamic light scattering method.
Determine particle size and particle size distribution! Example of measuring the particle size of silica and alumina particles in an aqueous medium.
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Wafer processing service
Aites wafer processing service that supports the birth of new technologies.
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Solar panel maintenance and upkeep - Solament SZ-200
The String Checker SZ-200 can identify solar panel failures on a string-by-string basis.
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Solar panel maintenance and upkeep - Solament SI-200
The Solar Panel Checker SI-200 can easily detect faulty panels during power generation.
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Solar panel maintenance and upkeep - Solament SR-200
With Solamente SR-200, panel inspection before interconnection is possible.
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Solar panel maintenance and upkeep - Solament SC-200
The CIS adapter SC-200 enables high-speed inspection of CIS thin-film panels simply by replacing the sensor unit of Solamente-iS.
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Microscopic EL/PL imaging device PVX1000+POPLI-μ
Microscopic PL observation of the fine structure of wafers in the solar cell manufacturing process.
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EL/PL imaging device PVX1000+POPLI-Octa
Wafer can be evaluated using photoluminescence during the solar cell manufacturing process.
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Solar cell PL imaging unit POPLI-3C
Solar cell 6-inch cell compatible PL excitation light source. By combining with the EL image inspection device PVX series, PL observation becomes possible.
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Solar Cell EL Image Measurement Device PVX330
Industry standard that vividly reveals potential defects in solar cells, EL image inspection device PVX330.
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Material evaluation using ultra-micro hardness testing for metals, polymers, plastics, etc.
It is also possible to analyze many material properties such as Young's modulus, plastic hardness, plastic deformation amount, elastic ratio, and creep! Variations in hardness and other properties can be expressed using standard deviation.
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Roundness / Circularity Measurement
We will respond to your request to evaluate roundness and circularity!
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Cross-sectional hardness of aluminum welds (spot welding)
Cross-sectional observation and hardness measurement of the weld joint were conducted! It was found that the void in the center is a blowhole.
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Analysis of fragrance components by GC-MS.
GC-MS is used for qualitative and quantitative analysis of low molecular organic substances! Data was obtained and compared using incense and sandalwood!
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Analysis of impurities in organic solvents
The aldol reaction progresses under the influence of temperature, humidity, and light! Example of impurity analysis in ethanol and acetone.
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Surface observation of IC chips implemented on LCD panels.
The observation target is an IC chip connected to the LCD panel using the COG mounting method! The circuit surface was clearly visible.
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Reverse bias test of power devices (up to 2000V)
It is possible to set bad standards (current values)! Evaluate device degradation and characteristics through high temperature and high voltage power supply.
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Analysis of film property changes due to UV irradiation.
Investigating how the light transmittance of blue light cut film changes using a spectrophotometer!
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Analysis of trace metal elements in liquid crystals
Depending on the panel size, it is possible to analyze using different ICP-AES/MS devices!
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Analysis of defects in overseas manufactured displays.
Numerous achievements in defect analysis! Detailed analysis is possible, from confirming phenomena to hypothesizing the mechanisms of defect occurrence.
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Solder Heat Resistance Test (SMD)
Reproducing temperature stress during transportation! Evaluating the presence or absence of delamination and cracks through heat treatment.
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