Shin Nippon Air Technologies Company Solution Division Official site

  • OTHER

We will exhibit a particle visualization system at "SEMICON Japan 2025" (December 17-19, 2025 / Tokyo Big Sight, East Exhibition Hall, East Hall 6, E6729).

Shin Nippon Air Technologies Company

Shin Nippon Air Technologies Company Solution Division

We will solve the issues related to the deterioration of defect rates due to fine particles and the cleaning of manufacturing sites. The fine particle visualization system developed by Shin Nippon Air Technologies, under the ViEST brand, combines a uniquely developed ultra-sensitive camera and light source to visualize fine particles in clean rooms and equipment. It can capture their behavior in real-time while also quantifying particle information, making it a world-class visualization system. Currently, we are expanding the sale of systems and tools, as well as contract technical services utilizing them, both domestically and internationally. We have particularly rich experience in the semiconductor industry and clean rooms. The following are some examples of applications, but by using our technology, we can strongly promote solutions to various issues such as the deterioration of defect rates caused by fine foreign substances, visualization of clean airflow, and concerns regarding site cleanliness. - Visualization surveys of fine particles and airflow in manufacturing lines and environmental improvements - Promotion of cleanliness in manufacturing equipment and environments - Cleanliness evaluation of various equipment performance - Improvement of yield and quality degradation caused by contamination issues - Support for research and development requiring visualization of fine particles and airflow - Evaluation of particle generation from products.

Is dust visible from the clean suit!?

Related Links

For more details, visit the "Shin Nihon Kucho ViEST" website.
We have various visualization equipment and software for the particle visualization system.

Related catalog

Mobile Visualization Counting Device "Type-S"

PRODUCT

Particle Visualization System

PRODUCT

Ultra-high sensitivity particle visualization dedicated camera "Particle Eye" series

PRODUCT

Surface Foreign Matter and Scratch Observation Tool D-Light Type-P

PRODUCT