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It is possible to set bad standards (current values)! Evaluate device degradation and characteristics through high temperature and high voltage power supply.

【Specifications and Service Details】 ■Test Voltage: Up to DC 2000V can be applied ■Applied Current: Up to 14mA ■Number of Tests: Up to 8 units (independent power supply) ■Compatible Modules: TO-247, TO-220, etc. (other packages require consultation regarding connection methods) ■Measurement Content: Monitoring of leakage current ■Temperature Range: Up to 200℃ (85℃/85% in high temperature and high humidity conditions)

Support for the difficulties in the development and evaluation of components, devices, and materials related to semiconductor products.

We provide a total solution from sample preparation of a series of processes for semiconductor products to reliability evaluation tests and failure analysis. You can utilize the necessary services as much as you need. A total solution means we support you from sample preparation to evaluation and analysis, addressing the difficulties in developing and evaluating components, devices, and materials related to semiconductor products (such as when evaluation samples cannot be prepared, evaluation methods are unclear, or there is no prior data). 【Sample Preparation】 ● Wafer Process ■ Arrangement of general-purpose TEG ■ Dicing ■ Chip sorting ■ Visual inspection ■ Packaging (chip trays, embossed taping) ● Packaging Process ■ Die bonding ■ Wire bonding ■ Flip chip mounting ■ Bump bonding ■ Package assembly

In-Situ Continuous Measurement Reliability Evaluation Testing Service

In-Situ continuous measurement reliability evaluation tests involve applying stress while measuring characteristics to conduct reliability assessments. ● Accurate understanding of failure time is possible In a read-out method where samples are taken from a stress environment at fixed times, failure can only be understood at the timing of the read-out, making it impossible to know the exact time of failure occurrence. In-Situ measurement allows for an accurate understanding of failure time. ● Detection of recoverable failures is possible Recoverable failures can cause significant issues in the market. In most cases, the read-out method makes it nearly impossible to detect these recoverable failures, but In-Situ measurement enables the detection of recoverable failures, allowing for accurate judgment/assessment. ● Monitoring of stress application conditions on samples is possible The stress application status and measurement data can be confirmed in real-time.

We thoroughly evaluate and verify power devices from every angle.

■Reliability Testing of Power Devices - Power Cycle Testing Constant current 600A max. (Vce=10V) Simultaneous thermal resistance measurement is also possible - 180℃ Compatible Liquid Bath Thermal Shock Testing Temperature range -65℃ to 150℃, -40℃ to 180℃ Liquid medium Galden D02TS/D03 Sample basket (maximum) W320 x H240 x D320 (mm) - Characteristic Evaluation using Power Device Analyzer Maximum voltage 3000V, maximum current 20A Wide compatibility from small components to power devices - Insulation Evaluation Ion Migration Testing Accelerated testing by applying a voltage higher than actual usage conditions in high temperature and high humidity environments Testing to confirm that migration does not occur within the guaranteed lifespan of the power device - High Temperature Reverse Bias/Gate Bias Testing Continuous monitoring of insulation resistance values in high temperature and high humidity environments Number of channels 120 channels ■Analysis and Examination of Power Devices - Failure Analysis of Power Chips - Analysis of Solder Joints - Grain Observation of Al Wires using Ultra-Low Acceleration Special SEM - Non-Destructive Observation of Semiconductor and Package Delamination

This is a list of devices used for analysis, evaluation, and testing services at AITES.

■Morphological Observation 　・Laser Microscope 　・SAM/SAT 　・X-ray Fluoroscopy Device 　・SEM/FE-SEM ■Electrical Characteristic Measurement 　・Curve Tracer 　・Power Device Analyzer ■Failure Analysis 　・EMS/IR-OBIRCH 　・EBIC ■Sample Processing 　・FIB 　・Rotary Polishing Table 　・Ion Polisher 　・Oblique Cutting Device ■Reliability Evaluation Testing 　・Liquid Chamber/Gas Chamber Thermal Shock Test Device 　・Constant Temperature and Humidity Chamber/Bias Test 　・Constant Temperature Chamber 　・HAST/PCT/PCBT 　・In-Situ Continuous Measurement Device ■ESD/Latch-Up Testing 　・ESD Tester (HBM/MM/CDM/Latch-Up) ■Optical Properties 　・Total Flux/Light Intensity Measurement System ■Physical Analysis 　・SEM+EDX/EPMA 　・FE-TEM+EDS/EELS 　・STEM+EDS ■Surface Analysis 　・AES 　・XPS 　・μFT-IR 　・AFM ■Chemical Analysis 　・GC-MS (HS/Thermal Decomposition) 　・LC-MS 　・Microscopic Raman Spectrometer

We are publishing an overview of ion migration evaluation and the details of the testing conducted!

For more details, please refer to the PDF document or feel free to contact us.

Contracting power cycle tests using a power cycle testing device! We will cooperate in improving quality along with failure analysis and assessment.

【Device Overview】 <Siemens (Mentor) "PWT2400A"> ■ Equipped with 4 units of 600A power supply for heating ■ Equipped with 16 units of -10V to 20V power supply for gates ■ Capable of testing up to 16 channels simultaneously ■ Tj measurement using a method compliant with JESD51-14 ■ Automatic transient thermal resistance measurement during testing ■ Equipped with a cooling plate that supports up to 200℃ ■ Standard fixtures for TO packages are also included ■ Compatible with water-cooled modules *For more details, please refer to the PDF document or feel free to contact us.*

Suitable for evaluation of die attach and TIM materials! We support everything from prototyping to evaluation.

For more details, please refer to the PDF document or feel free to contact us.

It is possible to apply up to 1000V in high temperature and high humidity environments for power devices! The degradation status of the device can also be monitored.

【Specifications】 Test Voltage: Up to DC 1000V can be applied (positive terminal common, protection resistance 110kΩ) Test Quantity: Up to 30 units (positive terminal side) Compatible Modules: TO-247, TO-220, etc. (Other packages available upon consultation: socket procurement possible) Measurement Content: Monitoring of leakage current Test Equipment: Temperature control range 105.0℃ to 142.9℃, humidity control range 75%RH to 100%RH Pressure range 0.020 to 0.196MPa (gauge pressure) 【Example Test Conditions】 JESD22-A110E, JEITA ED-4701-100A (Test Method 302A), etc. *For more details, please refer to the PDF document or feel free to contact us.