すべての製品・サービス
31～52 件を表示 ／ 全 52 件
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[Data] Products for consumer electronics manufacturing processes
For consumers! We feature shape and thickness inspection using color aberration line sensors.
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In-process measurement of wafer step height
The "CHRocodile 2 DPS color aberration confocal sensor" is equipped with two independent measurement channels.
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Control of CMP processes and grinding processes in the semiconductor industry.
The "CHRocodile 2 IT sensor" can measure the thickness of wafers during work processing.
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High-speed and flexible glass thickness measurement
High flexibility and efficiency! The measurement points are spread along a line with a maximum length of 12.5 mm.
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Taking measurement technology to the next level.
Improvement of process and quality assurance using high-end chromatic aberration confocal sensors.
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Quality inspection and continuous correction for the glass industry.
It is possible to visualize various defects of bulk materials in the production process.
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Introduction of sensors for battery manufacturing and component inspection.
Introducing the measurement principles of each sensor, corresponding sensors, product information, and ease of use!
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[Information] Introduction to the CHRocodile Series
We are publishing information about non-contact thickness and shape measurement sensors!
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[Data] Non-contact thickness and shape measurement sensor
Many measurement examples are included! We are introducing CHRocodile's applications for semiconductors.
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Optical area scanner "Flying Spot Scanner"
High-speed area scanning unaffected by vibrations. For online, offline, quality control, and wafer inspection applications.
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New color aberration confocal sensor 'CHRocodile MPS 2L'
No damage, deformation, or impact on shape to the sample! Compatible with hot end processes as well.
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CHRocodile 2DPS＋CHRocodile 2IT
Introduction of wafer thickness measurement sensors for semiconductor in-process applications!
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High-speed camera 'CHRomatic Vision Camera'
This is a high-speed, high-precision line camera for inline appearance inspection, also suitable for wafer inspection applications.
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Chromatic Aberration Confocal Sensor 'CHRocodile C'
Accurate and stable measurements even at a maximum tilt of ±45°! Compatible with all surfaces.
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CHRocodile 2IT DW1000
Introducing the CHRocodile 2IT DW1000 with analog I output!
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Presitech Japan Co., Ltd. Company Profile
Specialist in laser material processing and optical measurement technology!
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Thickness measurement - Optical sensor 'CHRocodile 2DW series'
Use an appropriate light source wavelength for doped wafers to accommodate challenging doped wafer thickness measurements.
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Thickness measurement - Optical sensor 'CHRocodile 2IT series'
Thickness measurement of various materials, capable of handling both during and after processing across a wide measurement range with a single device! Also suitable for wafer inspection applications.
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Area scan sensor "Flying Spot Scanner"
No XY stage needed! Thickness and distance (displacement) measurement possible using the principle of spectral interference! Also suitable for wafer inspection applications.
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3D Measurement - Line Sensor 'CHRocodile CLS'
High-speed and wide-range 3D shape measurement with sub-micron accuracy. Features a wide tolerance angle that can accommodate edges and slopes. Suitable for wafer inspection applications as well.
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Small optical thickness/distance measurement sensor 'CHRocodile C'
Recommended inexpensive type focused on cost. Sensors for thickness measurement and distance measurement. Also suitable for wafer inspection applications.
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Image sensor "CHRomatic Vision Camera"
No need to worry about the effects of vibration! Achieves easy operability without relying on the environment! Also suitable for wafer inspection applications.
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