All products and services
31～60 item / All 366 items
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Solar Cell EL Image Measurement Device PVX330
Industry standard that vividly reveals potential defects in solar cells, EL image inspection device PVX330.
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EL/PL Imaging Device PVX1000+POPLI-Octa
The wafers in the solar cell manufacturing process can be evaluated using photoluminescence.
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Microscopic EL/PL imaging device PVX1000+POPLI-μ
Microscopic PL observation of the fine structure of wafers in the solar cell manufacturing process.
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Wafer processing service
We create new value in semiconductor wafer services such as film formation processing and regeneration processing!
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Solar panel maintenance and upkeep - Solament SZ-200
The String Checker SZ-200 can identify solar panel failures on a string-by-string basis.
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Solar panel maintenance and upkeep - Solament SI-200
The Solar Panel Checker SI-200 can easily detect faulty panels during operation.
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Solar panel maintenance and upkeep - Solament SR-200
With Solamente SR-200, panel inspection before interconnection is possible.
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Solar panel maintenance and upkeep - Solament SC-200
The CIS adapter SC-200 enables high-speed inspection of CIS thin-film panels simply by replacing the sensor unit of Solamente-iS.
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Total support service for cross-sectional grinding, processing, observation, and analysis.
We undertake contract processing and manufacturing of cross-sections of various parts and materials.
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Total support service for chemical analysis
We conduct surface analysis, foreign substance analysis, and organic composition analysis.
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Total Support Service for Reliability
We conduct environmental testing, as well as non-destructive observation and electrical property measurements.
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Panel computer repair for factory equipment
Prevent production line stoppage! Extend lifespan with panel computer repair.
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X-ray fluoroscopy and CT scanner 'Cheetah EVO'
Inspection equipment effective for initial observation of various components and materials, including implementation substrates and electronic parts.
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Component Analysis: GC-MS Gas Chromatography Mass Spectrometer
Introducing a new device! We present an analytical method aimed at the qualitative and quantitative analysis of components contained in samples.
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[Data] Ion Migration Evaluation Test
We are publishing an overview of ion migration evaluation and the details of the testing conducted!
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The state of analysis techniques, including defect analysis of joints, adhesion, and assembly parts.
Introducing the perspectives from which analysis and analytical techniques should be advanced!
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[Data] Examples of Defects and Analysis of Solar Cells
We are presenting examples of defect analysis and investigation conducted through various approaches!
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Wafer processing
Introduction of "Evaluation Pattern Wafers," "Silicon Wafer Sales," and "Compound Semiconductors"! We can accommodate everything from small lots to customized orders.
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Analysis of semiconductor diffusion layers using sMIM
Detect changes in concentration as changes in C! The dC/dV signal can also be obtained, which is effective for analyzing the diffusion layer.
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Regarding the bonding interface of Cu wire bonding.
We introduce the features of Cu wire bonding and the selection of cross-section preparation methods!
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[Information] About the bonding interface of Cu wire bonding
It provides a detailed explanation of various wire bonding methods, results, and discussions!
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Environmental testing in a high-power constant temperature and humidity chamber.
Two high-power constant temperature and humidity chambers have been introduced! Ideal for temperature cycle tests and temperature and humidity cycle tests for automotive parts and more.
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Power cycle testing and characteristic evaluation
Contracting power cycle tests using a power cycle testing device! We will cooperate in improving quality along with failure analysis and assessment.
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Module prototyping and thermal resistance evaluation
Suitable for evaluation of die attach and TIM materials! We support everything from prototyping to evaluation.
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We provide comprehensive support for reliability testing, analysis, and evaluation of electronic components!
Transitional thermal measurement possible power cycle testing, with a customized luminescence/OBIRCH analysis device, where a skilled team thoroughly evaluates and analyzes power devices!
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Evaluation pattern wafers: Support for small lots to customized orders.
We accept several prototype processes without any issues, and we are well-known for our very flexible response, from mask design to cross-sectional dimension measurement.
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X-ray fluoroscopy and CT examination device 'Observation case of IC type coil'
X-ray CT observation allows for the assessment of the winding condition of coil wiring! We will introduce examples of observing IC-type coils, which differ from X-ray transmission observation.
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X-ray fluoroscopy and CT examination device 'Observation case of inductive coil'
[Comparison images available] Internal shape abnormalities can also be observed non-destructively! We compared X-ray CT and cross-sectional SEM.
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X-ray fluoroscopy and CT examination device: BGA solder crack analysis case study
X-ray fluoroscopy observation, oblique CT observation, orthogonal CT observation, etc.! Introduction of BGA solder crack analysis cases.
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X-ray fluoroscopy and CT examination device: Case of LED malfunction observation (X-ray fluoroscopic observation)
[Video Available] Captured the moment of defect occurrence! Introducing a case of X-ray observation using LED.
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