All products and services
31～60 item / All 351 items
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Module prototyping and thermal resistance evaluation
Suitable for evaluation of die attach and TIM materials! We support everything from prototyping to evaluation.
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We provide comprehensive support for reliability testing, analysis, and evaluation of electronic components!
Transitional thermal measurement possible power cycle testing, with a customized luminescence/OBIRCH analysis device, where a skilled team thoroughly evaluates and analyzes power devices!
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Evaluation pattern wafers: Support for small lots to customized orders.
We accept several prototype processes without any issues, and we are well-known for our very flexible response, from mask design to cross-sectional dimension measurement.
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X-ray fluoroscopy and CT examination device 'Observation case of IC type coil'
X-ray CT observation allows for the assessment of the winding condition of coil wiring! We will introduce examples of observing IC-type coils, which differ from X-ray transmission observation.
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X-ray fluoroscopy and CT examination device 'Observation case of inductive coil'
[Comparison images available] Internal shape abnormalities can also be observed non-destructively! We compared X-ray CT and cross-sectional SEM.
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X-ray fluoroscopy and CT examination device: BGA solder crack analysis case study
X-ray fluoroscopy observation, oblique CT observation, orthogonal CT observation, etc.! Introduction of BGA solder crack analysis cases.
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X-ray fluoroscopy and CT examination device: Case of LED malfunction observation (X-ray fluoroscopic observation)
[Video Available] Captured the moment of defect occurrence! Introducing a case of X-ray observation using LED.
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X-ray fluoroscopy and CT examination device: Observation case of chip resistors
CT observation is effective for analysis as it allows for three-dimensional observation! Here, we will introduce examples of observing chip resistors.
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X-ray fluoroscopy and CT examination device: Observation case of a microphone
[Video Available] X-ray fluoroscopy observation & orthogonal CT observation! We will introduce observation cases of microphones.
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Cheetah EVO accessory function: Reflow simulator
[Video available] You can observe the heating process in real-time! Introducing the features of Cheetah EVO.
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X-ray fluoroscopy and CT examination device: Case study of wisdom tooth observation
[Video available] Introducing the X-ray CT image (orthogonal CT) of a wisdom tooth (third molar).
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X-ray fluoroscopy and CT examination equipment: Examples of combined use of transmission observation and image processing technology.
Detecting differences between normal product images and defective product images through image processing! Introducing a case study of the combined use of transmitted observation and image processing technology.
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X-ray fluoroscopy and CT scanner: Device appearance and main specifications
Introduction of YXLON's multi-focus Cheetah EVO! It can be used for various applications, including electronic components.
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[Information] Liquid Crystal Materials and Their Analytical Techniques
Easily explain the technical capabilities of Aites by analyzing molecular structures with diagrams and tables!
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[Case Study] X-ray Fluoroscopy and CT Examination Equipment
Numerous examples of "BGA solder crack analysis," "surface mount LEDs," and "chip resistor observation" using X-ray fluoroscopy and angled CT observation are included!
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DMA (Dynamic Mechanical Analysis)
We offer a variety of measurement modes, including double cantilever beam bending and three-point bending with free support!
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DSC (Differential Scanning Calorimetry)
Observe the degree of endothermic/exothermic reaction of the sample! The temperature range is possible from -90°C to 550°C.
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TG-DTA (Thermogravimetric Differential Thermal Analysis)
Output the temperature difference between the sample and the reference material as a DTA signal! Change the temperature according to a constant program.
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TMA (Thermomechanical Analysis)
Information on thermal expansion, thermal contraction, and glass transition temperature can be obtained in multiple measurement modes!
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TOF-SIMS analysis of organic matter
As an example of organic matter analysis, I would like to introduce a case where polyethylene glycol was analyzed.
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TOF-SIMS analysis of trace contaminants
The analysis sensitivity of TOF-SIMS is high at the ppm level, making it effective for analyzing trace contamination!
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AFM (Atomic Force Microscope)
High-resolution imaging with a micro probe! Achieving nano-level structural analysis.
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Analysis of crystallinity in resin materials using micro-Raman spectroscopy.
By using micro-Raman, it is possible to evaluate the crystallinity in a fine range (1μm and above)!
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GCMS analysis of liquid crystal components
Comparison of components in liquid crystal panels using gas chromatography-mass spectrometry (GC-MS) is published!
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Service "Replacement from CRT Monitor to LCD Display"
Attention companies struggling with display issues on CRT monitors for machinery and equipment: lower cost and shorter delivery time than equipment replacement.
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Analysis of multilayer materials using micro-Raman.
Depth-direction measurements using Raman spectroscopy! Material analysis of each layer is possible from the surface of multilayer films.
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Slice processing using isomet.
We will introduce a slicing process that allows you to keep the created cross-section as it is!
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Cutting process using a wire saw
Cross-section preservation is possible! By dividing the sample with precision cuts using a wire saw, individual cross-sections can be produced.
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Cross-sectional observation pre-treatment (sample cutting and resin embedding)
We will introduce the pre-treatment for cross-sectional observation using devices for sample cutting, such as band saws!
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Attention those struggling with material properties in the manufacturing process at the Institute of Chemical Reaction Mechanisms!
What is the reason for this discoloration on the surface? Why are there cracks in such places? These issues will be resolved from the perspectives of electrons, atoms, molecules, and chemical reaction mechanisms!
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