All products and services
121～150 item / All 351 items
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Sample preparation techniques for foreign object analysis
We utilize various sample processing techniques to provide rapid analysis results! Let us introduce our sample processing technology.
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[Data] Whisker Observation
Support from reliability testing observations to 3D measurement! It is possible to conduct whisker evaluations while eliminating transportation risks.
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Structural analysis of prismatic Li-ion batteries.
Observation using optical microscopy and ultra-low acceleration FE-SEM! Detailed structural analysis and elemental analysis are possible.
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HAST test of power devices
It is possible to apply up to 1000V in high temperature and high humidity environments for power devices! The degradation status of the device can also be monitored.
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[Data] Processing damage caused by mechanical grinding method
If you have any dissatisfaction or questions regarding the finish of the grinding, please consult Aitesu!
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[Data] Cross-sectional observation of solar cell modules
We have published cross-sectional observations of the fracture surface and elemental maps of the fracture area!
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Tabletop SEM (Scanning Electron Microscope) 'TM3030Plus'
Observation of samples and elemental analysis are possible! It can be utilized not only in the semiconductor and electronic components fields but also in life sciences and biological fields.
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Crack observation using a tabletop SEM (scanning electron microscope).
Fine cracks are easy to see! No conductive treatment is required, allowing for quick and detailed observation.
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[Data] Cross-sectional observation of neodymium magnets using a tabletop SEM (scanning electron microscope)
We have published cross-sectional observations in clear vision mode and normal/standard mode!
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[Information] Cross-section production method
We are publishing the main cross-section manufacturing methods, processing conditions, advantages & disadvantages, etc.!
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Analysis of difficult-to-detect substances by reaction thermal decomposition GC-MS.
By adding a special reagent to the sample and heating it, it becomes possible to detect substances that are usually difficult to detect!
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High-temperature latch-up test
Devices that require operation in high-temperature conditions! Introducing latch-up testing at high temperatures.
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[Data] Example of load unloading mode and color filter measurement using an ultra-micro hardness tester.
Examples of hardness measurement for color filters and results obtained from hardness measurements using graphs are provided.
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Research Institute of Chemical Reaction Mechanisms, Material Degradation Analysis (Decomposition and Deterioration of PET)
We will suggest appropriate analysis methods based on the condition of polymer materials and samples!
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Chemical Reaction Mechanism Research Institute Phthalate Ester 1H NMR
Distinguish and identify compounds with similar structures! You can obtain information such as the number of protons and structural characteristics.
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Shall we clarify the molecular structure of organic compounds more clearly?
Distinguish compounds with similar molecular structures through NMR analysis, elucidating the binding positions of side chains and substituents, as well as branching structures!
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Analysis of resin materials (for semiconductor LED applications)
It is possible to analyze resin materials and evaluate the characteristics that affect product performance!
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Cross-sectional observation of copper terminals and elemental analysis using SEM/EDX.
Investigation of the joint condition and joining methods of crimp terminals, as well as the types of materials! Introduction to cross-sectional observation and elemental analysis using SEM/EDX.
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Ink immersion test for implemented parts (dye and pry)
Introducing a test that allows for the observation of fracture and delamination layers by permeating coloring liquids and fluorescent liquids!
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Data: Outgassing analysis using headspace GC-MS analysis method.
Publication of headspace GC-MS analysis method and case study of outgassing component analysis of liquid crystal panel polarizers!
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Total coordination from reliability testing to observation.
Reduce the risks of transportation and storage! We provide consistent services from reliability testing to observation.
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Crystal analysis by EBSD: Aluminum weld joint (spot welding)
We will introduce an analysis example confirming that the welded area has a large distribution of grain crystals.
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Observation of aluminum welding joints
Introducing examples of aluminum welding observation. Internal observation through X-ray fluoroscopy and CT inspection allows for clearer observation after cross-section preparation!
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Cross-sectional observation of large samples (expansion valve)
Introducing a case study on the cross-section preparation of a large sample (65mm × 28mm) and the observation of its internal structure!
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Observation of the coating layer of eyeglass lenses using a microtome.
Section preparation using a microtome! Introducing examples of observing lens coating layers and multilayer films.
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Measurement of haze for transparent materials, total light/diffuse transmittance measurement service.
For transparent materials such as glass and ITO! Measurement and evaluation of various transparent resins before and after UV exposure are also possible.
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We assist in research and development with analysis and chemical reaction mechanisms!
It will lead to the determination of development direction and acceleration! We will respond with abundant technology, knowledge, and equipment.
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Panel Polarizer Degradation Analysis
Examples of degradation analysis of panel polarizers are published! We conducted degradation analysis through reliability testing and outgassing analysis using HS-GCMS.
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Evaluation of transmittance and yellowness (yellow degree) using a color difference meter.
Digitizing transparency and color into numerical data! Objectively evaluating transparency rate and yellowing degree!
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Detection sensitivity due to differences in acceleration voltage during SEM-EDX analysis.
Appropriate acceleration conditions for accurate analysis results! The detection depth of EDX changes with differences in acceleration voltage!
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