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Crystal Test Handler (Inspection Classifier)

- High-speed processing of classification by frequency inspection and electrical characteristics inspection - Compatibility with various sizes through attachment exchange

■High-speed processing Stable high-speed processing has been achieved through index drive using servo motors and reducers, probe operation via direct motor drive, and direct drive in the sorting section. ■Supports various inspections ■Automatic recovery function from work jams By automatically discharging the disk entry section, the system can recover from work jams without operator intervention, thereby improving operational efficiency.

Shibuya Industrial Co., Ltd. Semiconductor Manufacturing Equipment

basic information

Corresponding Work: SMD Type Work Supply Method: Parts Feeder Measurement Station: 1 or 2 Stations Number of Classifications: Maximum 128 Classifications Capacity: 400 pieces/min (varies depending on conditions) Device Dimensions: 1200×800×1520 mm Device Weight: 420 Kg

Price range

Delivery Time

Model number/Brand name

EH192

Applications/Examples of results

LED electronic components crystal

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