We would like to introduce the "Microscopic FT-IR Imaging Measurement" that we conduct. It allows for the visualization of the distribution of substances as a two-dimensional image within a specified plane. It becomes possible to evaluate changes in the distribution of substances that are difficult to assess with regular point measurements through visual images.

We offer the "CP Processing Device Arblade5000_Wide Area Cross-Section Milling." The "Arblade5000" enables extensive processing by combining a high milling rate with wide area cross-section milling capabilities. With the wide area cross-section milling holder, the cross-section milling width can be expanded up to 10mm, making it effective for electronic components that require wide area milling. 【Features】 ■ Approximately double the width of processing is possible ■ The previously localized observation range can be significantly expanded ■ Equipped with a cooling temperature adjustment function to control temperature rise caused by ion beam irradiation ■ The observable range is approximately 8mm

Our company conducts "IOL testing of discrete semiconductors." We repeatedly turn the power ON/OFF in a room temperature environment, applying stress to the device due to temperature changes caused by the device's own heat generation during power ON. During power OFF (cooling), forced cooling is also performed using a fan. Additionally, before conducting the tests, we use representative samples to make adjustments to reach the test temperature conditions. It is possible to adjust the current/time during heating and the fan capacity/timing during cooling.

We will introduce the observation of metallic structures through chemical treatment. By performing chemical treatment on metallic samples, it is possible to clearly observe the metallic structure. Observing the structure can reveal the condition of the sample and the history of applied heat and stress, providing clues about the quality of the product and any defects based on the structure's shape. In the catalog, you can find details on the observation of metallic structures, such as the macrostructure of aluminum plates and the soldered parts of copper terminals. Additionally, we offer other services such as cross-sectional observation and various analysis services. Please feel free to contact us if you have any requests.

At Aites Co., Ltd., we have newly introduced "Microscopic FT-IR" this fiscal year. The "Microscopic FT-IR," which combines FT-IR and optical microscopy, allows for the measurement of tiny substances on the order of several tens of micrometers, which are difficult to measure with conventional FT-IR, using an aperture (field of view diaphragm). There are three main measurement methods for Microscopic FT-IR: "transmission method," "reflection method," and "ATR method." While the transmission method is the basic measurement method in Microscopic FT-IR measurements, the reflection method or ATR method may be more suitable depending on the shape of the sample and the feasibility of sampling.

Aites Co., Ltd. will be exhibiting at the 1st "[Kyushu] Semiconductor Industry Exhibition" held at Marine Messe Fukuoka B Hall in Fukuoka City, Fukuoka Prefecture. We will be introducing our analysis technology services, so please stop by. We sincerely look forward to your visit.

In the methods for cross-section preparation in semiconductor structure observation and defect analysis, CP, FIB, and mechanical polishing are mentioned, each having its own advantages and disadvantages, making it necessary to consider which method to use. In recent years, CP and FIB have become more common, and it seems that the use of mechanically polished methods, which require technical skill, is decreasing. However, it is still not something to be dismissed. While there are merits and demerits, it is possible to achieve cross-section preparation with mechanical polishing that is on par with FIB and CP. At our company, based on years of accumulated know-how, we propose the most appropriate processing method according to the observation purpose, sample composition, and structure.

We would like to introduce an example of cross-sectional observation of mounted components conducted by our company. Using commercially available computer circuit boards, we observed the solder joints of mounted components and the internal structure of the components with a metal microscope. The observation modes of the metal microscope include bright field observation, dark field observation, and polarized light observation, among others. Additionally, there are observations using transmitted light, and the observation mode is selected according to the sample. By conducting cross-sectional observations before and after reliability testing, we can evaluate the reliability of the product. When observing, it is important to select an appropriate "observation mode" to clearly capture the condition of the solder joint interface and defects such as cracks.

We would like to introduce the "strain measurement in thermal shock testing" conducted by our company. A sample with strain gauges attached was set up in the thermal shock testing device, and the wiring of the strain gauges was connected to an external data logger to record strain data in real time during the test. For two types of copper-clad laminates, the strain behavior during the thermal shock test was observed, and it was noted that significant strain occurred with changes in temperature. It was found that FR-1 exhibited greater strain compared to FR-4.

We would like to introduce a case of particle size measurement of positive electrode active materials using laser diffraction conducted by our company. In air or liquid, laser light is irradiated onto the particles, and the angular dependence of the intensity of the light scattered by the particles is measured. By measuring the angular dependence of the scattered light intensity, the particle size distribution (particle size distribution) is calculated from the data. Using commercially available reagents as samples, measurements were conducted in a dry state without dispersing in a solvent. The particle size measurement results for NMC oxide showed a monodisperse state with particle sizes below several tens of micrometers, and the median diameter was calculated to be 12 micrometers.

We will introduce examples of cross-sectional observations of various components mounted on a board called an organic substrate. Inside various electronic devices around us, there are substrates equipped with electronic components. When observing the mounted substrate, you can see that numerous components are tightly soldered together. It is necessary to verify that these components are properly joined, as they will not function correctly otherwise. Please contact us if you are considering observations before and after reliability testing or cross-sectional observations.

We would like to introduce our "Chemical Analysis - Trust Us Service." When conducting component analysis of foreign substances or stains on products, it can be challenging to determine whether organic analysis or inorganic analysis is more suitable, and which specific analysis within organic or inorganic is the most appropriate. We provide a comprehensive service for customers who are struggling with the selection of analysis methods. Since each analysis device can measure different targets, it is necessary to choose a method that fits the purpose based on the information available.

We will introduce the observation of the shape of conductive particles in COG implementation. ICs and liquid crystal panels are implemented using the COG method with ACF (anisotropic conductive film). A resin ball is used as the core, and a metal layer (such as nickel or gold) for conductivity is deposited on its surface. During connection, the particles deform appropriately to electrically connect the IC and the panel. To confirm the degree of particle deformation and connection status, cross-sectional observations were conducted, revealing that the particle deformation was at a "medium" level, indicating an appropriate degree of deformation. By examining the deformation of conductive particles from both the planar and cross-sectional directions, we can explore the correlation with display defects. Please feel free to contact us for any inquiries regarding panel-related defects.

Since a malfunction was suspected in the switch section of the appliance that would not power on, we will introduce a case study along with the work flow. First, we check for any shape changes such as swelling, cracking, or discoloration through visual observation. In the electrical check, we confirm whether the malfunction can be reproduced and whether it is an open or short circuit. An internal observation using X-rays revealed that the contact terminals inside the switch had melted, scattered, and disappeared, resulting in an open failure. Ultimately, we will submit a report that includes the consideration of the cause. We also accept inquiries for analysis consultations after non-destructive testing, so please feel free to contact us.

Our company analyzes the spectra of UV-curable resins before and after UV irradiation. We irradiate UV-curable resin (acrylic type) with ultraviolet light and obtain Raman spectra before and after irradiation. By analyzing the Raman spectra, we can estimate the curing reaction to some extent. For a more detailed analysis of the curing mode, analyses such as GCMS are necessary, but our company can provide not only structural estimation but also reaction estimation through spectral analysis.

The "tensile test" is a test that measures the load and displacement (elongation) when a material is pulled at a constant speed, in order to determine the physical and mechanical properties of the material. By pulling the test specimen in a temperature-controlled chamber, it is possible to determine and understand the temperature dependence of these properties. Our company is capable of conducting material property tests under temperature-controlled conditions. We can also propose conditions tailored to the materials and properties you wish to measure. Please feel free to consult with us.

This is an example of evaluating the maximum pore diameter and pore size distribution of a non-woven fabric sheet using the bubble point method. The sample is immersed in a chemical solution, and air pressure is applied. The pressure is increased until it overcomes the surface tension of the chemical solution absorbed in the sheet, resulting in the appearance of bubbles; this pressure is referred to as the bubble point. The maximum pore diameter can be calculated based on the bubble point pressure and the surface tension of the chemical solution.

"Dynamic SIMS" is a secondary ion mass spectrometry method that can detect trace amounts of all elements (from H to U) in samples with high sensitivity, ranging from ppm to ppb. It allows for qualitative analysis and depth profiling, and additionally enables high-precision quantitative analysis using standard samples (conducted at our partner company's facility). The minimum beam diameter is approximately 30 µm, and it can be further reduced depending on the material.

This article introduces a pretreatment method to enable the analysis of substances that are difficult to analyze using GC/MS. The pretreatment that converts difficult-to-analyze substances into analyzable forms is called "derivatization." Methods such as esterification, acylation, and silylation are used selectively according to the types and characteristics of the difficult-to-analyze substances. GC/MS measurements were conducted on citric acid solutions and citric acid solutions after esterification. It was found that citric acid, being a carboxylic acid, was not effectively detected without derivatization, but after esterification, trimethyl citrate was detected, confirming the presence of citric acid. By performing appropriate derivatization, more accurate analysis becomes possible.

We will introduce a case where a series of analyses from failure location identification to cross-sectional observation was conducted on oxide-based all-solid-state batteries that were destroyed by reliability testing. Thermal analysis revealed a tendency for strong heat generation on the side, and X-ray transmission observation showed a white linear contrast anomaly near the boundary where heat generation was observed in the X-ray transmission image. It is suspected that some abnormality is occurring in the white line area. When cross-sectional SEM observation was performed on the area where the anomaly was visible, layer delamination was observed. It is speculated that the positive (negative) electrode layers expanded and contracted repeatedly due to reliability testing, leading to delamination between the current collector and the electrolyte layer.

This is an introduction to the analysis of adhesive components in mica sheets using GC/MS. To investigate what components are contained in the mica sheets, spectroscopic measurements were conducted, suggesting that silicone-based adhesives are used. To determine the composition of the silicone-based adhesive, GC/MS measurements were performed. It was found that pentacyclooctasiloxane is used, and it was also discovered that dibutyl phthalate is added as a plasticizer and linear saturated hydrocarbons such as tridecane are added as lubricants.

Aites will be exhibiting at the "10th Seminar of the Advanced Power Semiconductor Subcommittee" held at the ANA Crowne Plaza Hotel Kanazawa! We will be introducing our unique analysis technology services, so please stop by! We sincerely look forward to your visit. Booth: ANA Crowne Plaza Hotel Kanazawa, Middle Banquet Hall "Zuiun" No. 43

This document introduces the characteristics of each spectroscopy method and the spectra obtained when comparing infrared spectroscopy and Raman spectroscopy. Both infrared spectroscopy and Raman spectroscopy are vibrational spectroscopies that investigate the vibrational energy of molecules, but the shapes of the spectra obtained from each method differ even when measuring the same substance. Infrared spectroscopy and Raman spectroscopy are complementary, and information that cannot be obtained from either analysis alone can be acquired more detailed and accurately by conducting both analyses. For more details, please refer to the published catalog.

We will be exhibiting at the "43rd Nano Testing Symposium (NANOTS2023)" held at the Senri Life Science Center in Toyonaka City, Osaka Prefecture! We will be introducing our latest analytical technology services, so please stop by! We sincerely look forward to your visit.

This is an example of analyzing the purity of diphosphorus pentasulfide using ion chromatography for the composition analysis of raw materials for all-solid-state batteries. Diphosphorus pentasulfide is one of the raw materials used in the production of electrolytes for sulfide-based all-solid-state batteries. As a pretreatment for IC measurement, the powder of diphosphorus pentasulfide was dissolved in alkaline water and converted into phosphate and sulfide salts. Subsequently, the sulfide ions were oxidized to sulfate ions to prepare the IC measurement solution. For more details, please refer to the published catalog. We encourage you to take a look.

We would like to introduce the analysis of good quality LCD displays from Aites Co., Ltd. First, we conduct optical microscope observations focusing on the FPC, FOG, COG, and sealing materials in the state of the cell panel as part of the appearance observation. Next, we disassemble the cell panel to check the sealing materials, PI film, and TFT shape. If any defects are found during the quality analysis, we will propose additional analyses such as cross-sectional observation of wiring and foreign matter analysis to investigate the causes. Please feel free to consult us when needed.

Aites participated in the "84th Autumn Academic Conference of the Japan Society of Applied Physics (JSAP EXPO Autumn 2023)" held at Kumamoto Castle Hall and three other venues! We sincerely thank everyone who visited our booth.

This article introduces a comparison between Raman spectroscopy analysis by AITES Inc. and FTIR. Spectroscopic analysis is suitable for component analysis of foreign substances and qualitative analysis. Both Raman and FT-IR can obtain spectra based on the structure of the analysis target. However, since each has its strengths and weaknesses, it is necessary to choose between the two depending on the analysis target.

We would like to introduce the dynamic viscoelasticity measurement of polyurethane rubber conducted by Aites Co., Ltd. DMA is an analysis that applies periodic oscillating loads to polymer materials and measures elasticity and viscosity as a function of temperature from the resulting stress and phase difference. In this instance, we conducted measurements using cylindrical rubber samples in compression mode. The measurement results indicated a glass transition temperature of -15.7°C from the temperature dispersion curve of Tan δ, and we created a master curve based on the time-temperature superposition principle. Please feel free to consult us when needed. 【Methods of Applying Load】 ■ Tension ■ Compression ■ Bending with both ends supported ■ Three-point bending with free support ■ Shear (sliding)

A commitment to environmental consideration and waste-free development and manufacturing is required in the field of technology, and there is a need for global contributions from a planetary perspective. This document introduces case studies that identify the substances of discarded and floating microplastics, as well as a comparative analysis of the degradation levels of recycled materials, assisting in the determination of their usability. We encourage you to read it. [Contents] ■ Case studies on the identification and analysis of microplastic substances ■ Comparative case studies of molecular weight distribution between unused polypropylene materials and recycled products (pellets) ■ Comparative analysis case studies of polyethylene terephthalate (PET) materials using microscopic IR analysis *For more details, please refer to the related products and catalogs below.