一般財団法人材料科学技術振興財団 MST Official site

[Analysis Case] Evaluation of Adhesive Tape Residue

We will identify the surface adsorbate components using TOF-SIMS.

Residue from adhesive tape can cause poor adhesion and peeling during the manufacturing process. When residue is suspected to be the cause of defects, TOF-SIMS, which can analyze the composition and distribution of surface contaminants, is effective. We will present a case where the surface of a silicon wafer was adhered with adhesive tape and measured with TOF-SIMS after peeling it off.

Related Link - https://www.mst.or.jp/casestudy/tabid/1318/pdid/14…

basic information

For detailed data, please refer to the catalog.

Price information

-

Delivery Time

Applications/Examples of results

Analysis of daily necessities.

[Analysis Case] Evaluation of Adhesive Tape Residue_C0197

PRODUCT

Distributors

Recommended products