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[Analysis Case] Observation of the Surface Morphology of ZnO Films

C0052.jpg

[Analysis Case] Observation of the Surface Morphology of ZnO Films

C0052.jpg
C0052.jpg

Capable of observing large-area surface shapes.

A scanning white light interferometer (optical interferometer) can perform high-precision, non-contact three-dimensional measurements of the surface shape of a sample with "high vertical (Z) resolution (0.1 nm) and a wide (X-Y) measurement field of view (50 μm to 4.2 mm)." It is capable of measuring up to a field of view of 4.2 mm × 4.2 mm.

Related Link - https://www.mst.or.jp/casestudy/tabid/1318/pdid/29…

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Analysis of electronic components.

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[Analysis Case] Surface Shape Observation of ZnO Film_C0052

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MST is a foundation that provides contract analysis services. We possess various analytical instruments such as TEM, SIMS, and XRD to meet your analysis needs. Our knowledgeable sales representatives will propose appropriate analysis plans. We are also available for consultations at your company, of course. We have obtained ISO 9001 and ISO 27001 certifications. Please feel free to consult us for product development, identifying causes of defects, and patent investigations! MST will guide you to solutions for your "troubles"!

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