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Spherical aberration correction function

TEM: Transmission Electron Microscopy

In a STEM device equipped with a spherical aberration correction function (Cs corrector), high-resolution observation and high-sensitivity analysis at the atomic level are possible. The resolution is approximately 0.10 nm.

Related Link - https://www.mst.or.jp/casestudy/tabid/1318/pdid/38…

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For detailed data, please refer to the catalog.

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Applications/Examples of results

Crystal structure evaluation and composition distribution evaluation

Spherical Aberration Correction Function_B0108

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