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New TOF-SIMS analysis service launched, ideal for organic EL analysis.

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New TOF-SIMS analysis service launched, ideal for organic EL analysis.

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1.jpg 打ち合わせ.jpg セミナー.jpg

It has become possible to analyze in depth without damaging organic components! The spatial resolution has also improved compared to conventional methods, allowing for evaluation in narrow areas.

In recent years, organic EL displays have shown a tendency for their arrangement to become finer in order to enhance image quality. MST has launched a new service that allows for precise evaluation of the film structure of the organic EL layer, which is essential for the development of organic EL.

Related Link - http://www.mst.or.jp/

basic information

When measuring small pixels of organic EL or targeting narrow areas, conventional TOF-SIMS measurements made it difficult to evaluate in the depth direction. By improving the measurement conditions, MST has made it possible to analyze narrow areas without damaging organic components.

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The delivery date may vary depending on the analysis conditions, so please feel free to contact us.

Applications/Examples of results

Evaluation of Organic EL Film Structure

Detailed information

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一般財団法人材料科学技術振興財団　MST
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MST is a foundation that provides contract analysis services. We possess various analytical instruments such as TEM, SIMS, and XRD to meet your analysis needs. Our knowledgeable sales representatives will propose appropriate analysis plans. We are also available for consultations at your company, of course. We have obtained ISO 9001 and ISO 27001 certifications. Please feel free to consult us for product development, identifying causes of defects, and patent investigations! MST will guide you to solutions for your "troubles"!

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