一般財団法人材料科学技術振興財団　MST Official site

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New TOF-SIMS analysis service launched, ideal for organic EL analysis.

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New TOF-SIMS analysis service launched, ideal for organic EL analysis.

It has become possible to analyze in depth without damaging organic components! The spatial resolution has also improved compared to conventional methods, allowing for evaluation in narrow areas.

In recent years, organic EL displays have shown a tendency for their arrangement to become finer in order to enhance image quality. MST has launched a new service that allows for precise evaluation of the film structure of the organic EL layer, which is essential for the development of organic EL.

Related Link - http://www.mst.or.jp/

basic information

When measuring small pixels of organic EL or targeting narrow areas, conventional TOF-SIMS measurements made it difficult to evaluate in the depth direction. By improving the measurement conditions, MST has made it possible to analyze narrow areas without damaging organic components.

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The delivery date may vary depending on the analysis conditions, so please feel free to contact us.

Applications/Examples of results

Evaluation of Organic EL Film Structure

Detailed information

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[Analysis Case] Depth Direction Analysis of RGB Elements in Organic EL Materials (OLED) Using TOF-SIMS A_C0243

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