一般財団法人材料科学技術振興財団 MST Official site

Strong support for research and development: "Contract Analysis Services"

We will conduct contract analysis of materials and products entrusted to us by our customers. We will handle everything from pre-treatment to measurement and provide analysis data.

MST offers various materials and research contract analysis, contract evaluation, and contract assessment services. Our knowledgeable sales representatives will propose the optimal analysis plan! With assured quality and reliable support, we leave no questions unanswered for our customers. We broadly accommodate contract analysis and contract evaluation in the electronics field, including semiconductors, metals, and batteries, as well as in the life sciences field, including pharmaceuticals, cosmetics, and food. - We accept inquiries regarding analysis methods. - Please feel free to contact us for a cost estimate for analysis. - Inquiries and applications regarding analysis are accepted via phone or contact form. 【Examples of Contract Analysis Data】 ○ TEM Analysis: Observation at the atomic level ○ SIMS Analysis: Evaluation of impurity concentration ○ XRD Analysis: Identification of crystals using X-rays For more details, please download the catalog or contact us.

Related Link - https://www.mst.or.jp/method/tabid/64/Default.aspx

basic information

【List of Analytical Methods】 *We also accept inquiries about methods not listed here. 'Measurement Methods' ○Mass Spectrometry SIMS - Secondary Ion Mass Spectrometry TOF-SIMS - Time-of-Flight Secondary Ion Mass Spectrometry ICP-MS - Inductively Coupled Plasma Mass Spectrometry Others ○Photoelectron Spectroscopy XPS - X-ray Photoelectron Spectroscopy UPS - Ultraviolet Photoelectron Spectroscopy ○Electron Microscopy Observation and Analysis AES - Auger Electron Spectroscopy SEM - Scanning Electron Microscopy EBIC - Electron Beam Induced Current Others ○Vibrational Spectroscopy FT-IR - Fourier Transform Infrared Spectroscopy Raman - Raman Spectroscopy ○X-ray Diffraction Related XRD - X-ray Diffraction SAXS - Small Angle X-ray Scattering XRR - X-ray Reflectivity ○SPM Related AFM - Atomic Force Microscopy SCM - Scanning Capacitance Microscopy SSRM - Scanning Spreading Resistance Microscopy ○Other Measurement Methods White Light Interferometry TG-DTA-MS, DSC - Thermal Analysis EMS - Emission Microscopy 'Processing and Treatment Methods' ○FIB Method - Focused Ion Beam Processing ○Processing for SSDP - Measurement Processing from the Substrate Side Others For more details, please download the catalog or contact us.

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For more details, please contact us.

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Strong support for research and development: "Contract Analysis Services"

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We provide comprehensive analysis in the field of electronics, including semiconductors, metals, and batteries, as well as in the life sciences sector, including pharmaceuticals, cosmetics, and food.

Strong support for research and development: "Contract Analysis Services"

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