[Analysis Case] Secondary Battery
Evaluation of the components distributed on the surface of a single particle of powder is possible.
We will introduce a case where a sheet coated with graphite negative electrode particles used in lithium-ion secondary batteries was analyzed using TOF-SIMS. It was confirmed that graphite and PVDF are distributed on the surface of a single powder particle. Time-of-flight secondary ion mass spectrometry (TOF-SIMS) is a method suitable for qualitative analysis and imaging of organic and inorganic substances on surfaces from the mass spectrum of secondary ions. It is effective for evaluating the distribution of minute foreign substances and stains due to its high resolution. Measurement method: TOF-SIMS Product field: Secondary batteries Analysis purpose: Composition distribution evaluation For more details, please download the materials or contact us.
basic information
For more details, please download the materials or contact us.
Price information
-
Delivery Time
Applications/Examples of results
Analysis of secondary batteries.
catalog(1)
Download All CatalogsNews about this product(1)
-
Technical Information "De-gassing Evaluation of Plating Samples (C0464)" and 4 other items published.
We have published the following five analysis case studies on the MST website: - Degassing evaluation of plating samples (C0464) - TDS analysis examples by representative materials and purposes (B0232) - Peptide sequence analysis using LC/MS/MS (C0466) - Metal contamination evaluation of Si wafer surfaces (B0233) - Metal contamination evaluation in SiN films (C0465) For more details, please visit the MST website. http://www.mst.or.jp/
-
Technical Information: Release of 'Distribution Evaluation of Powder Particle Surfaces by TOF-SIMS' and 3 other items.
We have published the following three analysis case studies on the MST website: - Distribution evaluation of powder particle surfaces using TOF-SIMS - Evaluation of thermal treatment temperature dependence of organic films using TDS - Degassing evaluation of resist films using TDS For more details, please visit the MST website. http://www.mst.or.jp/
Recommended products
Distributors
MST is a foundation that provides contract analysis services. We possess various analytical instruments such as TEM, SIMS, and XRD to meet your analysis needs. Our knowledgeable sales representatives will propose appropriate analysis plans. We are also available for consultations at your company, of course. We have obtained ISO 9001 and ISO 27001 certifications. Please feel free to consult us for product development, identifying causes of defects, and patent investigations! MST will guide you to solutions for your "troubles"!