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[Analysis Case] Analysis of the HTM Layer in Perovskite Solar Cells

img_C0724_1.jpg

[Analysis Case] Analysis of the HTM Layer in Perovskite Solar Cells

img_C0724_1.jpg
img_C0724_1.jpg

Evaluation of component and depth direction distribution is possible.

Perovskite solar cells have excellent conversion efficiency in a film form and can be manufactured at low cost, leading to active research and development towards practical application. TOF-SIMS (Time-of-Flight Secondary Ion Mass Spectrometry) is effective for component analysis of the HTM layer (hole transport layer), evaluation of main components, dopants, and the depth distribution of impurities. This document presents a case study of depth analysis from the HTM layer to the perovskite layer. Measurement method: TOF-SIMS Product field: Solar cells Analysis purpose: Identification, distribution evaluation For more details, please download the document or contact us.

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[Analysis Case] Analysis of the HTM Layer of Perovskite Solar Cells_C0724

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