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[Analysis Case] Depth Direction State Evaluation of Tin (Sn) Surface

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[Analysis Case] Depth Direction State Evaluation of Tin (Sn) Surface

img_C0735_2.jpg
img_C0735_2.jpg img_C0735_1.jpg

Evaluation of modified layers and altered layers through surface treatment is possible!

TOF-SIMS has good depth resolution and can obtain fragment ions corresponding to bonding states, allowing for the evaluation of layer structures near the surface, within a few nanometers. This document presents a case study analyzing the layer structure of a tin plate surface based on the information obtained from the measurement of standard samples of tin oxide and hydrated tin oxide. By applying this technology, it is possible to evaluate modified layers and altered layers due to surface treatment.

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Measurement method: TOF-SIMS Product fields: Electronic components, manufacturing equipment and parts, polymer materials Analysis objectives: Evaluation of chemical bonding states, impurity evaluation and distribution assessment

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Analysis of electronic components, manufacturing equipment and parts, and polymer materials.

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[Analysis Case] Evaluation of Depth Direction State of Tin (Sn) Surface_C0735

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