What is a HAADF-STEM image?
HAADF-STEM: High-Angle Annular Dark Field Scanning Transmission Electron Microscopy
■Principle HAADF-STEM (High-angle Annular Dark Field Scanning TEM) images are obtained by scanning a finely focused electron beam across the sample and detecting the electrons that are scattered at high angles using an annular detector. ■Features Materials with a larger Z2ρ scatter more at high angles ↓ Heavy elements appear dark in STEM images and bright in HAADF-STEM images. Since contrast is obtained that is proportional to atomic number (Z), it is also referred to as Z-contrast imaging.
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For detailed data, please refer to the catalog.
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Applications/Examples of results
Shape evaluation and composition distribution evaluation