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[Analysis Case] Evaluation of Foreign Substances on the Surface of 300mm Wafers

The coordinate linkage function with the foreign object inspection device allows for the evaluation of specific foreign objects.

It is possible to identify the components of foreign substances confirmed by the foreign substance inspection device using a TOF-SIMS installed in a clean room. After evaluating the foreign substances following CMP cleaning, copper and hydrocarbon components were detected from the substances of interest. A wide distribution of the same components was observed around the foreign substances. This suggests that the foreign substance is more likely to be cleaning residue resembling a watermark rather than a particle.

Related Link - https://www.mst.or.jp/casestudy/tabid/1318/pdid/24…

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Applications/Examples of results

Analysis of LSI and memory.

[Analysis Case] Evaluation of Foreign Matter on the Surface of a 300mm Wafer_C0043

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