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[Analysis Case] Structural Evaluation of Magnetic Head MTJ Section

c0337.jpg

[Analysis Case] Structural Evaluation of Magnetic Head MTJ Section

c0337.jpg
c0337.jpg

High-resolution TEM observation using Cs-corrected TEM

By using a Cs-corrected TEM device that compensates for spherical aberration, it is possible to observe the cross-sectional structure of devices with high resolution. In this case, we present data from high-resolution (HR)-TEM observations of the MTJ: magnetic tunnel junction part, extracted from a commercially available hard disk. Thus, it is possible to clearly observe the structure even in multilayer structures of ultra-thin metal films.

Related Link - https://www.mst.or.jp/casestudy/tabid/1318/pdid/71…

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Analysis of electronic components and magnetic elements.

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[Analysis Case] Structural Evaluation of Magnetic Head MTJ Section_C0337

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