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[Analysis Case] Residue Analysis of Cotton Swabs with Ethanol

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[Analysis Case] Residue Analysis of Cotton Swabs with Ethanol

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c0201.jpg

Analysis of stains and cleaning residues that are not visible under an optical microscope is possible using TOF-SIMS.

In general, to remove dirt, a cotton swab may be dipped in ethanol and used for wiping. When the surface of a Si wafer was wiped with a cotton swab dipped in ethanol, an analysis was conducted using TOF-SIMS to determine what was distributed on the surface. The Si wafer wiped with the cotton swab showed stains that were not visible under an optical microscope, and it was found that these were due to the cotton swab. TOF-SIMS is effective for analyzing stains that are not visible under an optical microscope and for cleaning residues.

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Analysis of LSI, memory, and electronic components.

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[Analysis Case] Residue Analysis of Cotton Swab with Ethanol_C0201

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