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Analysis of trace metal elements in the environment

ICP-MS: Inductively Coupled Plasma Mass Spectrometry

Metal elements suspended in environments such as clean rooms and production lines can adhere to or contaminate products, potentially leading to a deterioration in product performance. With ICP-MS, exposure tests can be conducted on clean Si wafers, allowing for the measurement of the amount of metal elements adhered to the surface at ppt levels. Additionally, we also offer the loan of Si wafers that have been pre-cleaned.

Related Link - https://www.mst.or.jp/casestudy/tabid/1318/pdid/39…

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For detailed data, please refer to the catalog.

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It is an analysis of the environment.

Analysis of Trace Metal Elements in the Environment_B0231

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