Analysis of trace metal elements in the environment
ICP-MS: Inductively Coupled Plasma Mass Spectrometry
Metal elements suspended in environments such as clean rooms and production lines can adhere to or contaminate products, potentially leading to a deterioration in product performance. With ICP-MS, exposure tests can be conducted on clean Si wafers, allowing for the measurement of the amount of metal elements adhered to the surface at ppt levels. Additionally, we also offer the loan of Si wafers that have been pre-cleaned.
basic information
For detailed data, please refer to the catalog.
Price information
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Delivery Time
Applications/Examples of results
It is an analysis of the environment.