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[Analysis Case] Evaluation of Diffusion Layer Shape of Image Sensors Using SCM

C0534_イメージセンサの拡散層形状評価_ページ_1.jpg
C0534_イメージセンサの拡散層形状評価_ページ_1.jpg

[Analysis Case] Evaluation of Diffusion Layer Shape of Image Sensors Using SCM

We provide consistent support from sample disassembly to measurement.

This document presents case studies evaluating the diffusion layer of image sensors in smartphones. Using a scanning capacitance microscope (SCM) capable of determining the p/n type of semiconductors, we assessed the distribution of the diffusion layer. By combining the results from cross-sectional and planar SCM, we obtained complementary and extensive information. SCM is one of the effective tools for evaluating the quality of image sensor diffusion layers and for failure analysis.

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Analysis of optical devices.

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[Analysis Case] Evaluation of Diffusion Layer Shape of Image Sensor by SCM_C0534

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