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AFM Data Collection

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AFM Data Collection

B0247_AFMデータ集_ページ_1.jpg
B0247_AFMデータ集_ページ_1.jpg

AFM: Atomic Force Microscopy Method

AFM is a method that scans the surface of a sample with a fine probe and measures nano-scale surface topography in three dimensions. It can measure a wide range of materials, not only for the evaluation of metals, semiconductors, and oxides, but also for soft materials such as hair and contact lenses. This document presents various AFM images of different materials.

Related Link - https://www.mst.or.jp/casestudy/tabid/1318/pdid/47…

basic information

For detailed data, please refer to the catalog.

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Applications/Examples of results

Analysis of LSI, memory, oxide semiconductors, pharmaceuticals, and daily necessities.

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AFM Data Collection_B0247

TECHNICAL

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MST is a foundation that provides contract analysis services. We possess various analytical instruments such as TEM, SIMS, and XRD to meet your analysis needs. Our knowledgeable sales representatives will propose appropriate analysis plans. We are also available for consultations at your company, of course. We have obtained ISO 9001 and ISO 27001 certifications. Please feel free to consult us for product development, identifying causes of defects, and patent investigations! MST will guide you to solutions for your "troubles"!

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