[Analysis Case] Evaluation of Specific Crystalline Grains in CIGS Thin-Film Solar Cells
Observation of orthogonal cross-sections at locations with characteristics identified in EBIC measurements of arbitrary cross-sections.
Insights into the relationship between electrical properties and crystals can be obtained through EBIC and EBSD, but the depth of information differs. For areas where electrical properties were characteristic in the EBIC distribution measurement, we created cross-sectional samples and conducted STEM imaging in the depth direction. Additionally, we measured electron diffraction for each crystal grain. This further clarified the relationship between electrical properties and crystal grains and grain boundaries. By performing STEM observation and electron diffraction measurements, it is possible to obtain localized information about specific crystal grains.
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Applications/Examples of results
Analysis of solar cells.
