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[Analysis Case] Evaluation of Material Structure of Organic EL (OLED)

c0490.jpg

[Analysis Case] Evaluation of Material Structure of Organic EL (OLED)

c0490.jpg
c0490.jpg

It is possible to identify components for each layer, pixel by pixel.

To improve the reliability of organic EL, which is expected to expand in demand in the future, detailed structural analysis, state analysis, and identification of degradation causes will become increasingly important. We will introduce examples of evaluating layer structures and materials using TOF-SIMS and LC/MS. With TOF-SIMS, we were able to evaluate the layer structure and the component information of each layer. We conducted analyses of the components revealed by TOF-SIMS using LC/MS and a fluorescence detector, allowing us to assess the emission wavelength and understand the structure of the components. Thus, the combination of TOF-SIMS and LC/MS enables detailed evaluations.

Related Link - https://www.mst.or.jp/casestudy/tabid/1318/pdid/42…

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[Analysis Case] Evaluation of Material Structure of Organic EL (OLED) C0490

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