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X-ray diffraction measurement using a 2D detector

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X-ray diffraction measurement using a 2D detector

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XRD: X-ray diffraction method

When measurements are conducted using a two-dimensional detector, information about the diffraction angle (2θ) as well as the tilt direction (χ) can be obtained simultaneously. The observed two-dimensional diffraction pattern can visualize characteristics such as the crystallinity and orientation of the material, making it effective for evaluating materials where orientation affects their properties.

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Analysis of oxide semiconductors, LSI, and memory.

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X-ray diffraction measurement using a 2D detector_B0212

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