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[Analysis Case] Verification of Reduction Treatment for Sn Oxide

C0544_Sn酸化物に対する還元処理の検証.jpg

[Analysis Case] Verification of Reduction Treatment for Sn Oxide

C0544_Sn酸化物に対する還元処理の検証.jpg
C0544_Sn酸化物に対する還元処理の検証.jpg

Comparison of XPS and computational simulations: Analysis of electronic states from the valence band spectrum.

XPS is a method for evaluating the composition and bonding state of a material based on the photoelectron spectrum from inner shell levels. On the other hand, the valence band spectrum, which reflects the states of the outer shell electrons, appears near the Fermi level. This document presents a case study that verifies the reduction treatment of Sn oxides by comparing and discussing the density of states calculated through first-principles calculations with the valence band spectrum obtained by XPS. Utilizing computational simulations allows for a deeper understanding of the XPS spectrum obtained.

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Analysis of oxide semiconductors and daily necessities.

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[Analysis Case] Verification of Reduction Treatment for Sn Oxide - Comparison of XPS and Computational Simulation - C0544

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