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GDMS切り抜き.jpg

Solid Analysis New Service Launch (GDMS)

GDMS切り抜き.jpg
GDMS切り抜き.jpg

Solid Analysis New Service Launch (GDMS)

We respond to your request to measure many elements with high sensitivity! Simultaneous analysis of over 70 elements, from major components to trace elements, is possible.

We have launched a new service using Glow Discharge Mass Spectrometry (GDMS) starting from May 15 (Monday). - Simultaneous analysis of over 70 elements, from major components to trace components at the ppb level, is possible. - Detection of C, N, and O at the ppm level, which was previously difficult. - Depth direction analysis is possible from nm to several tens of µm.

Announcement of the launch of the new MST GDMS service.

basic information

Silicon carbide (SiC) and gallium nitride (GaN), which are used as wide bandgap semiconductor materials, have high chemical resistance and cannot be completely dissolved, making impurity analysis through chemical analysis difficult. On the other hand, as the wide bandgap semiconductor market continues to grow year by year, the demand for sensitive measurement of many elements is also increasing. Therefore, MST is introducing GDMS, which does not require pretreatment, and will start a new impurity analysis service. Additionally, as this is a renewal of the service through in-house production, we will be able to report data in a shorter lead time than before.

Price range

Delivery Time

Applications/Examples of results

<Applicable Examples> - Wide bandgap semiconductor field Impurity analysis in SiC, GaN, and Ga2O3 - Battery field Elemental analysis of active materials in lithium-ion battery cathode sheets - Ceramics field Impurity analysis of alumina powder - Steel industry Purity evaluation through impurity analysis

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