[IP Method] Ar Ion Polishing Processing
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The IP method is a type of polishing technique that uses ion beams for processing.
The IP method is a technique that utilizes the sputtering phenomenon, where sample atoms are ejected from the sample surface when an ion beam with aligned energy and direction is irradiated onto the sample. The ion species used is typically a noble gas (Ar in MST) that does not pose concerns about chemical reactions with the sample. In the AES analysis of the processed surface, the components of the shielding plate (Ni, P) were below the detection limit.
basic information
After IP processing of the card edge connector, we conducted reflection electron image observation. We performed reflection electron image observation on cross-sections prepared by the IP method and mechanical polishing method. In the IP method, the Cu crystal grains were clearly observed, and there were no polishing scratches.
Price information
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Delivery Time
Applications/Examples of results
It is suitable for the preparation of samples for the following observations and analyses: - Cross-sectional observation of laminated films with different hardness - Cross-sectional observation of films where delamination occurs at the interface - Observation of crystal grains (EBSD) - FIB processing (for TEM observation) and AES analysis
Detailed information
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Please consult with us first. ★ We will start with a proposal for an analysis plan ★ We can, of course, meet at your company for discussions. We will carefully explain the analysis results and leave no questions unanswered. Please contact us at 03-3749-2525 or info@mst.or.jp!
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We will hold a visiting seminar. ★ We offer free seminars with engineers tailored to our customers' needs ★ Depending on your requests, we will introduce analysis techniques and explain analysis data. ◆ Example seminar content - A broad explanation of MST analysis methods - A detailed explanation of specific analysis methods from the principles - Explanation of the analysis data requested by the customer Please contact us at 03-3749-2525 or info@mst.or.jp!
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MST is a foundation that provides contract analysis services. We possess various analytical instruments such as TEM, SIMS, and XRD to meet your analysis needs. Our knowledgeable sales representatives will propose appropriate analysis plans. We are also available for consultations at your company, of course. We have obtained ISO 9001 and ISO 27001 certifications. Please feel free to consult us for product development, identifying causes of defects, and patent investigations! MST will guide you to solutions for your "troubles"!